DX centers in Al0.3Ga0.7As/GaAs analyzed by point contact measurements
- 15 August 1998
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 84 (4) , 2034-2039
- https://doi.org/10.1063/1.368261
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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