Mechanical stress analysis of an LDD MOSFET structure
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 43 (9) , 1525-1532
- https://doi.org/10.1109/16.535345
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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