Noval detection scheme for the analysis of hydrogen and helium by secondary ion mass spectrometry

This publication has 13 references indexed in Scilit:

• Measurements of the accumulation of hydrogen at the silicon-silicon-dioxide interface using nuclear reaction analysis
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
• Determination of hydrogen concentration depth profiles in a-Si:H by Secondary Neutral Mass Spectrometry (SNMS)
  Journal of Non-Crystalline Solids, 1989
• Quantitative analysis and depth profiling of rare gases in solids by secondary-ion mass spectrometry: Detection of (CsR)+ molecular ions (R=rare gas)
  Journal of Vacuum Science & Technology A, 1988
• Quantitative analysis using sputtered neutrals in a secondary ion microanalyser
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• High sensitivity hydrogen analysis using elastic recoil
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• Depth distributions of low-energy 4He implanted in solids
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• A New SIMS Instrument: The Cameca IMS 4F
  Published by Springer Nature ,1986
• Depth distributions of 1H, 2H, and 4He implanted into HgCdTe and CdTe measured by secondary ion mass spectrometry
  Applied Physics Letters, 1984
• Flash x radiography of laser-accelerated targets
  Applied Physics Letters, 1982
• Quantitative hydrogen depth-profiling using SIMS
  Applications of Surface Science, 1981