Electrical characterization and alloy scattering measurements of LPE GaxIn1-xAs/InP for high frequency device applications
- 1 July 1981
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 54 (1) , 64-68
- https://doi.org/10.1016/0022-0248(81)90250-5
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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