A 20 MHz test vector generator for producing tests that detect single 4- and 5-coupling faults in RAMs
- 31 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- A realistic self-test machine for static random access memoriesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Enhanced fault modeling for DRAM test and analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Testing for coupled cells in random-access memoriesIEEE Transactions on Computers, 1991
- Test Pattern Generation for API Faults in RAMIEEE Transactions on Computers, 1985
- An Improved Method for Detecting Functional Faults in Semiconductor Random Access MemoriesIEEE Transactions on Computers, 1985
- Exhaustive Test Pattern Generation with Constant Weight VectorsIEEE Transactions on Computers, 1983
- On sets of Boolean n-vectors with all k-projections surjectiveActa Informatica, 1983
- Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access MemoriesIEEE Transactions on Computers, 1980
- Two applications (for search theory and truth functions) of Sperner type theoremsPeriodica Mathematica Hungarica, 1973
- Families of k-independent setsDiscrete Mathematics, 1973