Electrical properties of CdSe thin films covered by dielectric layers of SixOy or Dy2O3
- 16 February 1973
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 15 (2) , 691-696
- https://doi.org/10.1002/pssa.2210150241
Abstract
No abstract availableKeywords
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- Limitations of the MOS capacitance method for the determination of semiconductor surface propertiesIEEE Transactions on Electron Devices, 1965
- Cadmium Selenide Thin Film Field Effect TransistorsJournal of the Electrochemical Society, 1965
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