Fault modeling of physical failures in CMOS VLSI circuits
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 37 (12) , 1528-1543
- https://doi.org/10.1109/31.101273
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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