Optical properties ofPd2Si
- 15 June 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 45 (23) , 13285-13292
- https://doi.org/10.1103/physrevb.45.13285
Abstract
Near-normal reflectivity measurements with polarized light have been performed on good quality single crystals of Si in the spectral range from 0.05 to 4 eV. Moreover, spectral ellipsometry from 1.4 to 5 eV and nonpolarized reflectivity from 3 to 12 eV have been used in order to Kramers-Kronig analyze the data and to obtain the dielectric functions. The results show strong anisotropy in the optical response for the polarization along the crystallographic c axis, or in the basal plane, of the hexagonal cell, according to the transport measurements. The optical properties of Si have been calculated within the local-density approximation using the semirelativistic linear-muffin-tin-orbital method. The band structure, the l-projected densities of states, the complex dielectric function, the optical conductivity, the optical reflectivity, and the electron-energy-loss spectrum have been obtained in the energy range from 0 to 5 eV. The agreement with the experimental data is rather good.
Keywords
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