On programmable memory built-in self test architectures
- 20 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- A BIST scheme using microprogram ROM for large capacity memoriesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
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- Built-In Self-Testing RAM: A Practical AlternativeIEEE Design & Test of Computers, 1987
- Efficient Algorithms for Testing Semiconductor Random-Access MemoriesIEEE Transactions on Computers, 1978