Femtosecond imaging of melting and evaporation at a photoexcited silicon surface
- 1 April 1985
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America B
- Vol. 2 (4) , 595-599
- https://doi.org/10.1364/josab.2.000595
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 10 references indexed in Scilit:
- Femtosecond-Time-Resolved Surface Structural Dynamics of Optically Excited SiliconPhysical Review Letters, 1983
- Time-Resolved Reflectivity Measurements of Femtosecond-Optical-Pulse-Induced Phase Transitions in SiliconPhysical Review Letters, 1983
- Femtosecond white-light continuum pulsesOptics Letters, 1983
- Amplification of 70-fs optical pulses to gigawatt powersApplied Physics Letters, 1982
- Phase transformation on and charged particle emission from a silicon crystal surface, induced by picosecond laser pulsesApplied Physics Letters, 1981
- Measurement of Lattice Temperature of Silicon during Pulsed Laser AnnealingPhysical Review Letters, 1981
- Generation of optical pulses shorter than 0.1 psec by colliding pulse mode lockingApplied Physics Letters, 1981
- Dynamics of laser-induced vaporization for ultrafast deposition of amorphous silicon filmsApplied Physics Letters, 1981
- Nonthermal pulsed laser annealing of Si; plasma annealingPhysics Letters A, 1979
- Picosecond Ellipsometry of Transient Electron-Hole Plasmas in GermaniumPhysical Review Letters, 1974