Total dose hardness assurance techniques for new generation COTS devices
- 1 December 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (6) , 3145-3150
- https://doi.org/10.1109/23.556918
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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