Acceptor states at the SiSiO2 int0erface generated by UV and their effect on electron mobility
- 31 January 1988
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 31 (1) , 49-51
- https://doi.org/10.1016/0038-1101(88)90085-8
Abstract
No abstract availableKeywords
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