A conductance DLTS system to analyse multiple exponential decays
- 1 November 1988
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 3 (11) , 1083-1093
- https://doi.org/10.1088/0268-1242/3/11/002
Abstract
An experimental system is described in which DLTS signals are analysed by fitting the transient to one or more exponentials. The quality of the measurements and the value of the technique is demonstrated by measurements of conductance DLTS on microwave GaAs MESFETS. The technique is shown to be rapid and very useful to determine the defect properties of commercial devices.Keywords
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