I/sub DD/ pulse response testing on analog and digital CMOS circuits
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- CMOS IC stuck-open-fault electrical effects and design considerationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Fault detection of combinational circuits based on supply currentPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Rapid Reliability Assessment of VLSICsPublished by Springer Nature ,1990
- An introduction to computing with neural netsIEEE ASSP Magazine, 1987
- Test Considerations for Gate Oxide Shorts in CMOS ICsIEEE Design & Test of Computers, 1986
- Design techniques for cascoded CMOS op amps with improved PSRR and common-mode input rangeIEEE Journal of Solid-State Circuits, 1984