Non-homogeneous electrical transport through silicon-on-sapphire thin films: Evidence of the internal stress influence
- 30 September 1982
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 25 (9) , 947-953
- https://doi.org/10.1016/0038-1101(82)90186-1
Abstract
No abstract availableKeywords
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