An investigation of carrier transport in thin silicon-on-sapphire films using MIS deep depletion Hall effect structures
- 1 May 1972
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 15 (5) , 531-534
- https://doi.org/10.1016/0038-1101(72)90155-4
Abstract
No abstract availableKeywords
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