X-ray study of the Ag Si (111)
- 20 September 1995
- journal article
- Published by Elsevier in Surface Science
- Vol. 339 (1-2) , L891-L896
- https://doi.org/10.1016/0039-6028(95)00640-0
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Monolayer-confined mixing at the Ag-Pt(111) interfacePhysical Review Letters, 1993
- Initial growth of Au on Ni(110): Surface alloying of immiscible metalsPhysical Review Letters, 1993
- C60 encapsulation of the Si(111)-(7×7) surfaceApplied Physics Letters, 1992
- Surface X-ray diffractionReports on Progress in Physics, 1992
- X-ray scattering study of Ag/Si(111) buried interface structuresPhysical Review Letters, 1992
- Atomic-structure-dependent Schottky barrier at epitaxial Pb/Si(111) interfacesPhysical Review Letters, 1990
- Interfacial superstructures studied by grazing incidence x-ray diffractionApplied Surface Science, 1990
- Structure of the Ge(111)-c(2 × 8) surface as determined from scattered X-ray intensities along crystal truncation rodsFaraday Discussions of the Chemical Society, 1990
- Ordering atand Si(111)/SiInterfacesPhysical Review Letters, 1986
- Schottky-Barrier Formation at Single-Crystal Metal-Semiconductor InterfacesPhysical Review Letters, 1984