Observation of dislocations in a silicon phototransistor by scanning electron microscopy using the barrier electron voltaic effect
- 31 January 1976
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 19 (1) , 37-40
- https://doi.org/10.1016/0038-1101(76)90130-1
Abstract
No abstract availableKeywords
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