New insights into the microscopic motion of dislocations in covalently bonded semiconductors by in-situ transmission electron microscope observations of misfit dislocations in thin strained epitaxial layers
- 16 August 1993
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 138 (2) , 533-546
- https://doi.org/10.1002/pssa.2211380222
Abstract
No abstract availableKeywords
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