Difference between the forces measured by an optical lever deflection and by an optical interferometer in an atomic force microscope
- 1 March 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (3) , 644-647
- https://doi.org/10.1063/1.1145131
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscopeApplied Physics Letters, 1990
- Combined scanning force and friction microscopy of micaNanotechnology, 1990
- Improved fiber-optic interferometer for atomic force microscopyApplied Physics Letters, 1989
- A differential interferometer for force microscopyReview of Scientific Instruments, 1989
- Force microscope using a fiber-optic displacement sensorReview of Scientific Instruments, 1988
- Atomic scale friction between the muscovite mica cleavage plane and a tungsten tipThe Journal of Chemical Physics, 1988
- Novel optical approach to atomic force microscopyApplied Physics Letters, 1988
- Summary Abstract: Scanning tunneling microscopy and atomic force microscopy for microtribologyJournal of Vacuum Science & Technology A, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986