Modelling the optical response of surfaces measured by spectroscopic ellipsometry: application to Si and Ge
- 10 April 1993
- journal article
- Published by Elsevier in Surface Science
- Vol. 285 (3) , 282-294
- https://doi.org/10.1016/0039-6028(93)90440-u
Abstract
No abstract availableThis publication has 39 references indexed in Scilit:
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