On the identification of N dangling bonds in SiN films using x-ray absorption studies
- 15 March 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 73 (6) , 2995-3000
- https://doi.org/10.1063/1.354075
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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