Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy
- 1 October 1999
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 70 (10) , 3970-3972
- https://doi.org/10.1063/1.1150022
Abstract
Shape and composition of electrochemically etched tungsten tips for use in scanning tunneling microscopy (STM) were investigated in a transmission electron microscope (TEM) with a Gathan imaging filter (GIP). The tips are prepared by a lamella drop-off technique. We observe typical tip radii of less than 10 nm. After a storage of some days under ambient conditions, an amorphous oxide film is detectable. The electron energy-loss spectroscopy confirms that the surface is contaminated by compounds that contain carbon, too.Keywords
This publication has 9 references indexed in Scilit:
- Preparation and characterization of electrochemically etched W tips for STMMeasurement Science and Technology, 1999
- Low thermal power electron beam annealing of scanning tunneling microscope tipsReview of Scientific Instruments, 1997
- An improved lamellae drop-off technique for sharp tip preparation in scanning tunneling microscopyReview of Scientific Instruments, 1997
- Electrochemical preparation of tungsten tips for a scanning tunneling microscopeReview of Scientific Instruments, 1996
- Preparation and characterization of tungsten tips for scanning tunneling microscopyReview of Scientific Instruments, 1994
- A convenient method for removing surface oxides from tungsten STM tipsReview of Scientific Instruments, 1993
- Characterization of tungsten tips for STM by SEM/AES/XPSAnalytical and Bioanalytical Chemistry, 1991
- Oxygen-induced sharpening process of W(111) tips for scanning tunneling microscope useJournal of Vacuum Science & Technology A, 1990
- Ion milled tips for scanning tunneling microscopyApplied Physics Letters, 1987