LFSROM: Basic Principle and BIST application
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 211-216
- https://doi.org/10.1109/edac.1993.386474
Abstract
A built-in self test (BIST) approach wherein the on-chip test pattern generator is basically the combination of a LFSR, on OR 2 network and a set of multiplexers is described. Given precomputed sequences of deterministic test vectors, it is illustrated by some examples that this LFSROM generator provides data storage performances comparable in quality to a ROM Author(s) Dufaza, C. UMR-CNRS, Univ. Montpellier II, France Chevalier, C.Keywords
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