Compositional mapping in biology: X rays and electrons
- 31 August 1984
- journal article
- Published by Elsevier in Journal of Ultrastructure Research
- Vol. 88 (2) , 135-142
- https://doi.org/10.1016/s0022-5320(84)80005-2
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
- STEM imaging of thick specimens with off-axis detectorsJournal of Electron Microscopy Technique, 1984
- High-Resolution Scanning Transmission Electron MicroscopyScience, 1983
- Condenser Aperture Misalignment and Solute Profile Asymmetries in STEM X-ray MicroanalysisJournal of Microscopy, 1983
- STEM studies of biological structureUltramicroscopy, 1982
- A revised expression for signal/noise ratio in EELSUltramicroscopy, 1982
- Thickness dependence of the stem ratio imageUltramicroscopy, 1982
- Heavy metal-containing surroundings provide much more “Negative” contrast by Z-imaging in stem than with conventional modesJournal of Ultrastructure Research, 1982
- Crystallographic orientation effects in energy dispersive X-ray analysisPhilosophical Magazine A, 1981
- Scanning transmission electron microscopy of thin specimensUltramicroscopy, 1976
- A High Resolution Electron Spectrometer for Use in Transmission Scanning Electron MicroscopyReview of Scientific Instruments, 1971