Analysis of the dependence of the subthreshold swing and the threshold voltage on the substrate voltage of thin-film SOI MOSFETs. Extraction of the interface state densities
- 31 December 1992
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 35 (12) , 1783-1786
- https://doi.org/10.1016/0038-1101(92)90261-a
Abstract
No abstract availableKeywords
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