Influence of the substrate orientation on Si incorporation in molecular-beam epitaxial GaAs

Abstract
The incorporation of Si in high‐purity lightly Si‐doped GaAs grown simultaneously on (100), (311)A, and (311)B GaAs substrates by molecular‐beam epitaxy has been studied. Photothermal ionization spectroscopy shows that Si is incorporated predominantly as a donor for growth on (100) and (311)B substrates, whereas low‐temperature photoluminescence shows that Si is incorporated predominantly as an acceptor for growth on a (311)A substrate. Spectroscopic and Hall‐effect measurements show that the dominance of Si donors in the samples grown on the (100) and (311)B substrates renders these samples n‐type while the dominance of Si acceptors in the sample grown on the (311)A substrate renders that sample p‐type.