A linear two-layer model for flat-band shift in irradiated MOS devices

This publication has 8 references indexed in Scilit:

• Electron irradiation effects in MOS systems
  IEEE Transactions on Electron Devices, 1974
• Charge storage in SiO2 under low-energy electron bombardment
  Applied Physics Letters, 1974
• Measured radiation effects in MOS capacitors with a proposed new model
  Applied Physics Letters, 1974
• A ‘four parameters’ model that fits the degradation curve ΔVG(VG) of MOS transistors under irradiation
  Solid-State Electronics, 1972
• Vacuum Ultraviolet Radiation Effects in SiO2
  IEEE Transactions on Nuclear Science, 1971
• Techniques for Investigating Integrated Circuit Dielectric Isolation Media
  IEEE Transactions on Nuclear Science, 1968
• Effects of ionizing radiation on oxidized silicon surfaces and planar devices
  Proceedings of the IEEE, 1967
• A model for radiation damage in metal-oxide-semiconductor structures
  Proceedings of the IEEE, 1966