Bias Stress Induced Instabilities in Amorphous Silicon Nitride / Crystalline Silicon and Amorphous Silicon Nitride / Amorphous Silicon Structures

This publication has 11 references indexed in Scilit:

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• Direct observation of the silicon nitride on amorphous silicon interface states
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• Role of hydrogen in the formation of metastable defects in hydrogenated amorphous silicon
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• Investigation of the Silicon Nitride on Hydrogenated Amorphous Silicon Interface
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• Resolution of amorphous silicon thin-film transistor instability mechanisms using ambipolar transistors
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• Assessment of lattice relaxation effects in transitions from mobility gap states in hydrogenated amorphous silicon using transient photocapacitance techniques
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