Improved differential heterodyne interferometer for atomic force microscopy
- 1 December 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (12) , 3697-3701
- https://doi.org/10.1063/1.1144494
Abstract
No abstract availableKeywords
This publication has 45 references indexed in Scilit:
- Atomic Force Microscope Using an Optical Fiber Heterodyne Interferometer Free from External DisturbancesJapanese Journal of Applied Physics, 1993
- Scanning Force Microscope Using a Common-path Optical Heterodyne Interferometer.Journal of the Japan Society for Precision Engineering, 1993
- First-order aberration of a double-focus lens made of a uniaxial crystalJournal of the Optical Society of America A, 1992
- Force Microscopy Using Common-Path Optical-Heterodyne InterferometerJapanese Journal of Applied Physics, 1991
- Measuring the nanomechanical properties and surface forces of materials using an atomic force microscopeJournal of Vacuum Science & Technology A, 1989
- Compact scanning-force microscope using a laser diodeOptics Letters, 1988
- Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscopeJournal of Vacuum Science & Technology A, 1988
- Molecular resolution images of amino acid crystals with the atomic force microscopeNature, 1988
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Scanning differential phase contrast optical microscope: application to surface studiesApplied Optics, 1985