Optimal test set design for analog circuits

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 294-297
https://doi.org/10.1109/iccad.1990.129906

Abstract

Given the high cost of testing analog circuit functionality, it is proposed that tests for analog circuits should be designed to detect faults. An algorithm is presented that reduces functional test sets to only those that are sufficient to find out whether a circuit contains a parametric fault. Examples demonstrate that drastic reductions in test time can be achieved without sacrificing fault coverage.

Keywords

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