Iddq testing for high performance CMOS-the next ten years

This publication has 10 references indexed in Scilit:

• CMOS bridging fault detection
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• An experimental chip to evaluate test techniques: chip and experiment design
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• An experimental chip to evaluate test techniques experiment results
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• CMOS scaling for high performance and low power-the next ten years
  Proceedings of the IEEE, 1995
• CMOS scaling into the 21st century: 0.1 µm and beyond
  IBM Journal of Research and Development, 1995
• IDDQ Testing in CMOS Digital ASICs
  Published by Springer Nature ,1992
• Functional and scan tests: The effectiveness of I/sub DDQ/ how many fault coverages do we need?
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1992
• Quiescent power supply current measurement for CMOS IC defect detection
  IEEE Transactions on Industrial Electronics, 1989
• Very small MOSFET's for low-temperature operation
  IEEE Transactions on Electron Devices, 1977
• Design of ion-implanted MOSFET's with very small physical dimensions
  IEEE Journal of Solid-State Circuits, 1974