Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids
- 1 May 1977
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 6 (3) , 207-219
- https://doi.org/10.1007/bf02660485
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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