Leakage currents of n+p silicon diodes with different amounts of dislocations
- 31 December 1969
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 12 (12) , 963-968
- https://doi.org/10.1016/0038-1101(69)90017-3
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
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