Low energy scanning electron microscopy combined with low energy electron diffraction
- 2 October 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 176 (1-2) , 397-414
- https://doi.org/10.1016/0039-6028(86)90184-6
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Prospects in high resolution X-ray photoelectron microscopyUltramicroscopy, 1985
- Investigation of ultra-thin Ag films on Ni with the photoelectron emission microscopeUltramicroscopy, 1985
- An analytical reflection and emission UHV surface electron microscopeUltramicroscopy, 1985
- Relationship between bulk structure and bounding surfaces in ZrO2Ultramicroscopy, 1984
- Observation of Surface Micro-Structures by Micro-Probe Reflection High-Energy Electron DiffractionJapanese Journal of Applied Physics, 1984
- Reflection electron microscopy (REM) of vicinal surfaces of fcc metalsUltramicroscopy, 1983
- UHV-SEM studies of surface processes: Recent progressUltramicroscopy, 1983
- Stem imaging and analysis of surfacesUltramicroscopy, 1983
- Soft X rays and fast atoms as image generators in photoelectron microscopyNature, 1983
- Rapid, pulse counting low-energy electron diffraction instrumentReview of Scientific Instruments, 1980