Timing-driven partial scan
- 10 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- On determining scan flip-flops in partial-scan designsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
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- A depth-decreasing heuristic for combinational logicPublished by Association for Computing Machinery (ACM) ,1990
- Designing circuits with partial scanIEEE Design & Test of Computers, 1988