Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance
- 1 June 1996
- journal article
- research article
- Published by Taylor & Francis in Quality Engineering
- Vol. 8 (4) , 601-613
- https://doi.org/10.1080/08982119608904671
Abstract
(1996). Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering: Vol. 8, No. 4, pp. 601-613.Keywords
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