Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe
- 13 October 1997
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 71 (15) , 2061-2063
- https://doi.org/10.1063/1.120446
Abstract
Use of a thin step etchedoptical fiber probe in a scanning near-field optical/atomic-force microscope (SNOM/AFM) produced frictional imaging. The probe was fabricated by the etching of an optical fiber to decrease its diameter and sharpen the tip end with a HF solution and by irradiating a CO 2 laser beam to bend the tip. The spring constant of the thin probe is 100 times smaller than that of a conventional optical fiber probe, which allows the probe to be used as a contact AFM mode and in frictional imaging.Keywords
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