Impact of VLSI from communications viewpoint
- 1 April 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 14 (2) , 204-205
- https://doi.org/10.1109/jssc.1979.1051166
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- A 64-kbit dynamic MOS RAMIEEE Journal of Solid-State Circuits, 1978
- X-ray exposure system using finely position adjusting apparatusJournal of Vacuum Science and Technology, 1978
- Precision electron beam exposure system, EB52Revue de Physique Appliquée, 1978
- A high-speed 1600-gate bipolar LSI processorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978
- Poly (Fluoro Methacrylate) as Highly Sensitive, High Contrast Positive ResistJournal of the Electrochemical Society, 1977
- Poly(vinylethers) as X‐Ray ResistsJournal of the Electrochemical Society, 1977
- A 100 PS bipolar logicPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1977
- Subnanosecond ED MOS IC using new technologyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1977
- Controlled saturation as an approach to high-speed logicPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1968