Search for aftereffects in tin oxide films

Time-differential perturbed-angular-correlation measurements made using ${}_{}{}^{111}{}_{}{}^{}\mathrm{In}$ probes, which decay through electron capture to ${}_{}{}^{111}{}_{}{}^{}\mathrm{Cd}$, have been performed on ${\mathrm{SnO}}_2$ films in order to check the existence of electron-capture aftereffects. Two different substrates were employed for the ${\mathrm{SnO}}_2$ films: an insulating quartz plate and a silver film. Measurements at room temperature coincide with previous results in powder samples. The results show no evidence of a fluctuating interaction arising from electron-capture aftereffects.