Low-Temperature Surface Cleaning of GaAs Using Trisdimethylaminoarsine
- 1 December 1994
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 33 (12B) , L1744-1747
- https://doi.org/10.1143/jjap.33.l1744
Abstract
We applied trisdimethylaminoarsine (TDMAAs) to the surface cleaning of GaAs (111)B substrates in a high-vacuum environment in order to lower the treatment temperature. The native oxide formed on the substrate was removed at substrate temperatures as low as 400°C under TDMAAs pressure. Characterizations by atomic force microscopy and secondary ion mass spectrometry showed that TDMAAs cleaning markedly improves the surface smoothness and reduces residual impurities (carbon and oxygen) compared to conventional thermal cleaning using As4. The photoluminescence spectra (77 K) of GaAs/AlGaAs quantum wells grown by molecular beam epitaxy directly (without a GaAs buffer layer) on a TDMAAs-cleaned substrate were comparable to those on a 500-nm-thick GaAs buffer layer after thermal cleaning.Keywords
This publication has 10 references indexed in Scilit:
- Growth Condition Dependence of Carbon Reduction in GaAs Chemical Beam Epitaxy Using Trisdimethylamino-Arsine and TrimethylgalliumJapanese Journal of Applied Physics, 1994
- Large scale surface structure formed during GaAs (001) homoepitaxyApplied Physics Letters, 1994
- Alternative group V sources for growth of GaAs and AlGaAs by MOMBE (CBE)Journal of Crystal Growth, 1992
- Surface reactions of dimethylaminoarsine during MOMBE of GaAsJournal of Crystal Growth, 1992
- Catalytic Precracking of Amino-As in Metalorganic Molecular-Beam Epitaxy of GaAsJapanese Journal of Applied Physics, 1992
- Effect of Atomic Hydrogen on GaAs (001) Surface Oxide Studied by Temperature-Programmed DesorptionJapanese Journal of Applied Physics, 1992
- Low-Temperature Cleaning of GaAs Substrate by Atomic Hydrogen IrradiationJapanese Journal of Applied Physics, 1991
- Incidence angle effect of a hydrogen plasma beam for the cleaning of semiconductor surfacesApplied Physics Letters, 1989
- Low-Temperature Surface Cleaning of GaAs by Electron Cyclotron Resonance (ECR) PlasmaJapanese Journal of Applied Physics, 1989
- Cleaning of MBE GaAs Substrates by Hydrogen Radical Beam IrradiationJapanese Journal of Applied Physics, 1987