Analytical modeling of the substrate effect on accumulation-mode SOI pMOSFETs at room temperature and at 77 K

This publication has 4 references indexed in Scilit:

• An analytical back-gate bias effect model for ultrathin SOI CMOS devices
  IEEE Transactions on Electron Devices, 1993
• An analytical model for back-gate effects on ultrathin-film SOI MOSFET's
  IEEE Electron Device Letters, 1991
• Model for the potential drop in the silicon substrate for thin-film SOI MOSFETs
  Electronics Letters, 1990
• MOS device modeling at 77 K
  IEEE Transactions on Electron Devices, 1989