Testability Considerotions in Microprocessor-Based Design
- 1 March 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Computer
- Vol. 13 (3) , 17-26
- https://doi.org/10.1109/mc.1980.1653526
Abstract
Microprocessors are difficult to test–many failure modes exist and access to internal components is limited. Design techniques that enhance testability can reduce the impact of these constraints.Keywords
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