Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry
- 1 March 2001
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 384 (1) , 37-45
- https://doi.org/10.1016/s0040-6090(00)01805-8
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
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