Additional X-ray and electron diffraction peaks of polycrystalline silicon films
- 1 March 1984
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 113 (1) , 59-72
- https://doi.org/10.1016/0040-6090(84)90388-2
Abstract
No abstract availableThis publication has 28 references indexed in Scilit:
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