LATERAL NONUNIFORMITIES (LNU) OF OXIDE AND INTERFACE STATE CHARGE
- 1 January 1978
- book chapter
- Published by Elsevier
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Time-dependent MOS breakdownSolid-State Electronics, 1976
- Image forces and the behavior of mobile positive ions in silicon dioxideApplied Physics Letters, 1973
- MOS surface potential and the gross nonuniformitySolid-State Electronics, 1973
- Dielectric breakdown induced by sodium in MOS structuresJournal of Applied Physics, 1973
- Admittance of an MOS device with interface charge inhomogeneitiesJournal of Applied Physics, 1972
- The Si-SiO2Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance TechniqueBell System Technical Journal, 1967