The optimistic update theorem for path delay testing in sequential circuits
- 1 August 1993
- journal article
- Published by Springer Nature in Journal of Electronic Testing
- Vol. 4 (3) , 285-290
- https://doi.org/10.1007/bf00971977
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A Path Delay Fault Simulator for Sequential CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Path delay fault simulation algorithms for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- SPADES: a simulator for path delay faults in sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- DYNAMITE: an efficient automatic test pattern generation system for path delay faultsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1991