Mesoplasmas and “second breakdown” in silicon junctions
- 23 September 1963
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 6 (5) , 511-521
- https://doi.org/10.1016/0038-1101(63)90036-4
Abstract
No abstract availableKeywords
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- Effect of Minority Carriers on the Breakdown of Point Contact RectifiersPhysical Review B, 1952
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