‘‘Tracking’’ tunneling microscopy
- 1 June 1988
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 59 (6) , 840-842
- https://doi.org/10.1063/1.1139790
Abstract
Simple modification of the electronics of a STM allows operation in various tracking modes. Profiles of steepest inclination, equal height, equipotential, electrical field lines, etc., can be traced out. The tunnel tip can also be locked to a surface extremity for indefinite time. Some of these possibilities were tested experimentally.Keywords
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