An x-ray optical study of layered phase growth in Au-Al thin film couples
- 1 September 1980
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 51 (9) , 4808-4812
- https://doi.org/10.1063/1.328313
Abstract
Specular x-ray reflections originating at grazing incidence at the boundary planes of thin laminated structures interfere to give the known Kiessig fringes. The change of this interference pattern during diffusion in thin multilayers is used for the study of phase formation in Au-Al thin film couples. Layered growth of Au2Al obeying a parabolic growth relation was observed in the temperature range from 50 to 80 °C. The activation energy of the process was found to be 1.05 eV.This publication has 7 references indexed in Scilit:
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